ADC Input Currents Measurement |
|---|
| Jakub Svatos, Jan Fischer, Jan Holub |
- Abstract:
- The contribution introduces the possible issue of internal CMOS Successive Approximation Register microcontroller's Analog-to-Digital Converters input currents. If the microcontroller also contains a multiplexer, it can lead to consequences caused by the sample-and-hold block that is part of a charge redistribution Analog-to-Digital Converter. The article presents its nature, the possibility of its measurement, and a simplified model of such an MCU analog inputs behavior. The simplified model and derived formulas can help the unacquainted user in a data acquisition system with the MCU design when measuring signal sources with non-negligible internal resistance. The introduced parameters, which cannot be found in datasheets, can be essential for users.
- Keywords:
- ADC, Current, Measurement
- Download:
- IMEKO-TC4-2023-07.pdf
- DOI:
- 10.21014/tc4-2023.07
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Symposium 2023
- Title:
26th IMEKO TC4 Symposium and 24th International Workshop on ADC and DAC Modelling and Testing (IWADC)
- Place:
- Pordenone, ITALY
- Time:
- 20 September 2023 - 21 September 2023