EVALUATION OF PROPERTIES OF NANO-CMM BY THERMAL DRIFT AND TILT ANGLE
Masanao Fujiwara, Kiyoshi Takamasu, Shigeo Ozono
Abstract:
We have started developing novel systems and key technology as “Nano-CMM project”. In this project, our intention is developing the CMM with nano meter resolution to measure three-dimensional positions, orientations and parameters of three-dimensional features. For developing Nano-CMM, we evaluate properties of stages for Nano-CMM by thermal drift and tilt angles. In this report, the thermal drift and tilt angles of stages of Nano-CMM were evaluated. Then we made the new prototype of Nano-CMM made of low thermal expansion iron steel to reduce the influence of thermal drift and we also propose new construction of Nano-CMM for reducing the effect by tilt angles.
Keywords:
CMM (coordinate measuring machine), nano meter measurement, thermal drift
Download:
PWC-2003-TC14-007.pdf
DOI:
-
Event details
Event name:
XVII IMEKO World Congress
Title:

Metrology in the 3rd Millennium

Place:
Dubrovnik, CROATIA
Time:
22 June 2003 - 28 June 2003
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