CALIBRATION OF INSTRUMENT CURRENT TRANSFORMERS WITH ATYPICAL SECONDARY CURRENT
Renata Styblíková, Karel Draxler
Abstract:
Methods enabling a determination of errors eI and dI for a high transformation ratio difference between a standard and tested instrument current transformers (ICT) are described in this article. A widespread method uses an automatic transformer test set for the measurement of a difference between a standard and tested ICT. A method transforming secondary currents to voltages and an indirect method using error measurement from magnetizing current are also described.
Keywords:
current transformer, errors, lock-in amplifier
Download:
PWC-2003-TC8-008.pdf
DOI:
-
Event details
Event name:
XVII IMEKO World Congress
Title:

Metrology in the 3rd Millennium

Place:
Dubrovnik, CROATIA
Time:
22 June 2003 - 28 June 2003
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