IMPROVING DYNAMIC RESISTANCE AND DIFFERENTIAL CAPACITANCE MEASUREMENT OF ACTIVE DEVICES
Henrique Quaresma, António Pedro Silva, António Serra
Abstract:
A numerical model of a general purpose commercial equipment for current versus voltage (I-V) and differential capacitance versus voltage (C-V) measurement of active devices is presented. The good agreement between the model results and experimental data show that the model takes into account the main error sources of the instrument and can be used as a base to perform error correction and to implement a calibration procedure.
Keywords:
dynamic resistance, differential capacitance, calibration method
Download:
PWC-2003-TC4-119.pdf
DOI:
-
Event details
Event name:
XVII IMEKO World Congress
Title:

Metrology in the 3rd Millennium

Place:
Dubrovnik, CROATIA
Time:
22 June 2003 - 28 June 2003
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