DESIGN-FOR-TESTABILITY IN EMBEDDED MEASUREMENT SYSTEMS |
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| Uwe Frühauf, Hellmut Leuterer |
- Abstract:
- Test and self-diagnosis are important for the reliability of embedded measurement systems. For such mixed-signal systems it was introduced any special methods of design-for-testability. This paper will discuss any problems of possible structures by using the analogue Boundary-Scan method and its implementation.
- Keywords:
- design-for-testability, analogue Boundary-Scan, embedded mixed-signal systems
- Download:
- PWC-2003-TC4-024.pdf
- DOI:
- -
- Event details
- Event name:
- XVII IMEKO World Congress
- Title:
Metrology in the 3rd Millennium
- Place:
- Dubrovnik, CROATIA
- Time:
- 22 June 2003 - 28 June 2003