UNCERTAINTY ANALYSIS OF THE ADC HISTOGRAM TEST USING TRIANGULAR STIMULUS SIGNALS |
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| F. Corrêa Alegria, A. Cruz Serra |
- Abstract:
- This paper addresses the uncertainty of the estimates of ADC testing obtained with the Histogram Method when a triangular stimulus is used. Expressions are presented for the computation of the standard deviation of the transition voltages and code bin widths. These can be used for the Ramp Vernier Test which is a novel test method which will be included in the new version of the IEEE 1057 standard currently in balloting.
- Keywords:
- histogram test, triangular stimulus, ramp vernier test
- Download:
- IMEKO-IWADC-2007-F135.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- IWADC 2007
- Title:
12th IMEKO TC4 International Workshop on ADC Modeling and Testing IWADC (together with XVth IMEKO TC4 International Symposium on Novelties in Electrical Measurements and Instrumentation) (IWADC)
- Place:
- Iasi, ROMANIA
- Time:
- 19 September 2007 - 21 September 2007