The basic information concerning opportunities of doctoral degree study in measurement and instrumentation in the Czech Republic is mentioned in the first part of the paper. The study is running usually as a specialisation of the branch control engineering. The separate study programme "Measurement and Instrumentation" is running at the Czech Technical University in Prague – Faculty of Electrical Engineering, which is described in the second part of paper in detail.

This paper deals with the assessment of the metrological performance of analog-to-digital converters in order to use them in some metrology applications. Hence, digitizers of a commercial DVM have been characterized under DC voltages, with respect of several parameters such as aperture time, dead time and the autozero function.

Semiconductor heterostructures of nanometric dimensions represent a challenge in Metrology, requiring innovations and new developments. A single quantum well is the simplest structure of this nature, the basis for many optoelectronic devices, like lasers. In this work it is calculated the eigenstates of electrons, light holes and heavy holes of quantum wells of GaAs into Al^0.2Ga^0.8As. It was varied the width of these wells by typical monolayer values, and evaluated implications in the electronic transitions from valence band to conduction band. Results demonstrated that uncertainties as less as 0.35 nm in the quantum well width cause optical transitions up to 13 meV.

A recent improvement on the ancillary instrumentation and on the acquisition software of the 100 kN and 500 kN INRIM six-component dynamometers makes it possible to measure the parasitic components at static conditions and during the weight transition too, in order to weigh up the influence of the dynamic phenomena on the value of axial load.
This paper presents the main results of the evaluation of the parasitic components arising in static and dynamic conditions on the INRIM 1 MN force standard machine by using the INRIM 500 kN six-components dynamometer. It shows that the values of dynamic component can be several time bigger that the values calculated at static conditions, and that they must be measured and monitored in order to avoid any influence on the machine-dynamometer interaction and on the uncertainty of the main axial load.

Basis weight of paper web is an important property for quality management, but rather slow and expensive to measure. It is known that light transmittance is related to basis weight and thus a potential means for estimating the basis weight of paper. The basis weight is of interest in quality management from single fibre scale (0.1 mm) to scale of paper machine control effects scale (more than 10 km). This paper studies the relationship between basis weight and light transmittance, and how the relationship changes over the eight orders of spatial scale magnitude. It was noticed that the correlation is best in fairly small scale such that the large scale variations do not change the relationship but white noise in measurement has been filtered out. In paper measurements noise reduction by filtering is powerful because the interesting information is divided over eight orders of scale magnitude. This means that high resolution results can be transformed to lower resolution measurements almost without any noise.