Automating Photometric Measurements Using LabVIEW-Python-Based AI: Enhancing Precision in Luminous Intensity, Responsivity, Illuminance, and Flux Analysis at Saudi Standards, Metrology, and Quality Organization-SASO-KSA

Mohammad D. AlMelfi, Rawan A. AlMutairi, Fahad A. AlMuhlaki, Saad A. Bin Qoud, Rayan A. AlYousefi, I. AlFaleh, N. Qahtani, A. El-Matarawey
Abstract:
This work explores the automation of a photometry laboratory by integrating LabVIEW as the primary control and data acquisition platform, coupled with a Python-based artificial intelligence (AI) algorithm for intelligent analysis and optimization. The system is designed to measure and analyze critical photometric parameters such as luminous intensity, luminous responsivity, illuminance, and luminous flux—all of which are essential for evaluating the performance of light sources like tungsten halogen lamps, LEDs, displays, and optical sensors. By automating traditionally manual processes, the system enhances both the accuracy and efficiency of photometric testing. LabVIEW provides an intuitive graphical interface to control instruments, log data, and visualize results in real time. Meanwhile, the Python AI component improves decision-making by learning from historical data, predicting trends, and detecting anomalies or inconsistencies in measurements. The AI model optimizes calibration routines, reduces human error, and enables adaptive testing scenarios based on environmental conditions or device behavior. Together, LabVIEW and Python form a powerful, flexible platform that brings modern intelligence to photometry labs, making them faster, smarter, and more reliable. This approach demonstrates how combining industrial automation tools with machine learning can revolutionize traditional optical testing environments, paving the way for advanced lighting technologies and robust quality assurance systems.
Download:
IMEKO-TC6-2025-022.pdf
DOI:
10.21014/tc6-2025.022
Event details
IMEKO TC:
TC6
Event name:
TC6 M4Dconf2025
Title:

2025 IMEKO TC-6 International Conference on Metrology and Digital Transformation

Place:
Benevento, ITALY
Time:
03 September 2025 - 05 September 2025