Measuring Privacy: Critical Reflections and Directions for a Metrology-Based Approach

Eulalia Balestrieri, Ilaria Amelia Caggiano, Francesco Picariello, Ioan Tudosa
Abstract:
Privacy measurement in digital systems lacks a standardised metrological framework to ensure reliable and comparable assessments. A metrological approach ensures that privacy measurements are reliable, reproducible, and comparable over time and across different contexts. In this work most common privacy metrics, including k-anonymity, ℓ-diversity, t-closeness, differential privacy, and mutual information, are critically evaluated, identifying their strengths and limitations from a metrological perspective. Initial directions and open challenges toward a metrology-based approach to privacy measurement are outlined, too.
Download:
IMEKO-TC6-2025-019.pdf
DOI:
10.21014/tc6-2025.019
Event details
IMEKO TC:
TC6
Event name:
TC6 M4Dconf2025
Title:

2025 IMEKO TC-6 International Conference on Metrology and Digital Transformation

Place:
Benevento, ITALY
Time:
03 September 2025 - 05 September 2025