RECENT ADVANCES OF THE LONG-TERM AVAILABLE DCC SCHEMA VERSION 3

Shanna Schönhals, Lutz Doering, Benjamin Gloger, Siegfried Hackel, Frank Härtig, Daniel Hutzschenreuter, Justin Jagieniak, Thomas Krah, Jan Loewe, Thorsten Schrader, Gamze Söylev Öktem
Abstract:
The aim of this publication is to provide an overview of the recent advances of the XML schema for digital calibration certificates. The motivation and benefits of digital calibration certificates is explained and the basic requirements to which the DCC complies are stated in Section 1. A representative selection of changes is presented and explained in Section 2; and finally, conclusions are drawn, and an outlook on further work is given in Section 3.
Keywords:
DCC, XML schema, data types, data elements
Download:
IMEKO-TC6-2022-033.pdf
DOI:
10.21014/tc6-2022.033
Event details
Event name:
M4Dconf2022
Title:

First International IMEKO TC6 Conference on Metrology and Digital Transformation

Place:
Berlin, GERMANY
Time:
19 September 2022 - 21 September 2022
Event details
Event name:
Special session at M4Dconf2022
Title:

First International IMEKO TC6 Conference on Metrology and Digital Transformation

Place:
Berlin, GERMANY
Time:
19 September 2022 - 21 September 2022
Event details
Event name:
M4Dconf2022 (2)
Title:

First International IMEKO TC6 Conference on Metrology and Digital Transformation

Place:
Berlin, GERMANY
Time:
19 September 2022 - 21 September 2022