DESIGN, SIMULATION, AND TEST STRATEGIES FOR ANALOG-TO-DIGITAL, DIGITAL-TO-ANALOG CONVERSION CHANNELS IN WIRELESS APPLICATIONS |
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| Sebastien Fievet, Sirag Gokoglu, Emmanuel Marais, Roberto Rivoir |
- Abstract:
- In this paper, considering as driving example an analog base-band processor for mobile communications, integrating complete A/D and D/A data conversion based IPs, as transmit/receive base-band ports, voice-audio codecs, auxiliary codecs, we will present an overview of a number of design-for-test, modeling, simulation, and test strategies, aiming to ensure both a complete and economical test of the chip. Our goal will be not only to highlight the effectiveness of a synergic deployment of techniques, like analog design-for-testability (DFT), design modeling, statistical analysis, correlation of electrical parameters, on-chip test overhead (ABIST = Analog BIST), on-board circuit overhead, definition of different test levels and specific test sequence, but also the imperative need to collect and exploit, within the project context, the complete fan of microelectronics “techno-cultures” [1], like design, characterization, test, and product engineering, without which a readily “time-to-market”, fully-tested product introduction would be not feasible.
- Download:
- IMEKO-IWADC-2003-64.pdf
- DOI:
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