A Novel Approach for Testing and Improving the Static Accuracy of High Performance Digital-to-Analog Converters
D. Macii
Abstract:
This paper deals with a novel strategy to face effectively cost and complexity issues associated with the static testing of last generation digital-to-analog converters (DACs). The proposed approach is based on a high-level model that takes advantage of the basic structural features common to most high-performance DACs, thus enabling a major reduction in the total number of input test vectors. The efficiency improvement resulting from this procedure not only decreases the overall testing time, but it also promotes the design of both inexpensive Built-In Self-Test (BIST) architectures and digital self-calibration schemes.
