A NEW APPROACH TO IN-SITU FORMTEST-INTERFEROMETRY

D. Doerner, A. Bai, P. Mangalasseril, T. Pfeifer
Abstract:
Interferometry is a common method for testing the form of ultra-precise components. However interferometrical measurements are very sensitive to external influences. Due to this reason, in-situ measurements are very difficult to perform, especially in the vicinity of production processes. In this paper we present a new concept for the integration of interferometers in a machine tool and first results of the analysis of fundamental influences on interferometers operated in-situ.
Keywords:
interferometry, in-situ measurement, simulation
Download:
PWC-2003-TC2-017.pdf
DOI:
-
Event details
Event name:
XVII IMEKO World Congress
Title:

Metrology in the 3rd Millennium

Place:
Dubrovnik, CROATIA
Time:
22 June 2003 - 28 June 2003