PRECISION WAVELENGTH METROLOGY WITH A FOURIER TRANSFORM SPECTROMETER
Damir Veza, Marc L. Salit, John C. Travis, Craig J. Sansonetti
Abstract:
We have investigated the intrinsic accuracy of the optical frequency scale in spectra acquired by a Fourier Transform Spectrometer (FTS). The uncalibrated accuracy of the FTS optical frequency axis is about 1 part in 105. This uncertainty can be reduced by at least two orders of magnitude using a multiplicative calibration correction derived from a single wavelength standard line. The work reported here describes a new approach to accurate calibration of the wavenumber scale for a UV-visible FTS, which we have used to measure accurate wavenumbers and Ar pressure shifts for the prominent lines of 198Hg.
Keywords:
Fourier Transform Spectrometer, wavenumber calibraton, Hg, pressure shift
Download:
PWC-2003-TC2-016.pdf
DOI:
-
Event details
Event name:
XVII IMEKO World Congress
Title:

Metrology in the 3rd Millennium

Place:
Dubrovnik, CROATIA
Time:
22 June 2003 - 28 June 2003
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