CONSIDERATIONS ON NANOHARDNESS MEASUREMENT

Z. Rymuza, M. Misiak, J. T. Wyrobek
Abstract:
Measurement of hardness on nano-scale is discussed. Methods and instruments used are described and energy definition of hardness is introduced. Results of nanohardness measurements of materials, in particular ultrathin films,used in Micro Electro Mechanical Systems (MEMS) technology are presented.
Keywords:
hardness, nanohardness measurement, MEMS materials
Download:
IMEKO-WC-2000-TC5-P171.pdf
DOI:
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Event details
Event name:
XVI IMEKO World Congress
Title:

Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future

Place:
Vienna, AUSTRIA
Time:
25 September 2000 - 28 September 2000