EXCESS NOISE IN THICK FILM PIEZORESISTORS ON A STEEL SUBSTRATE |
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| D. Crescini, D. Marioli, E. Sardini, A. Taroni |
- Abstract:
- The work reports the measurements of the excess-noise coming from the thick-film piezo-resistors (TFRs) deposited on metallic substrates. The purpose of this paper is to single out the best combination of conductive, dielectric and piezoresistive inks in order to minimise the electronic noise. At this purpose a comparison between the excess noise measurements made of the same inks and geometric characteristics but screen printed and fired on alumina substrates, are reported. Moreover, the article gives a description of the measurement instrumentation used and, in particular, of the low noise preamplifiers.
- Keywords:
- thick-film piezoresistors, noise measurement, metallic substrates
- Download:
- IMEKO-WC-2000-TC4-P117.pdf
- DOI:
- -
- Event details
- Event name:
- XVI IMEKO World Congress
- Title:
Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future
- Place:
- Vienna, AUSTRIA
- Time:
- 25 September 2000 - 28 September 2000