AN ACTIVE APPROACH FOR HIGH RESOLUTION MEASUREMENT OF TECHNICAL SURFACES |
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| W. Osten, D. Kayser, W. Jüptner |
- Abstract:
- The wide scale inspection of extended technical components with respect to the recognition of typical surface features (shape, texture, roughness) needs the combined application of different measurement techniques together with new tools for the consistent analysis and description of the measuring results. The new concept of scalable topometry meets the demands of wide scale surface topometry. Controlled by the evaluation of scale-independent surface features based on fractal geometry, different measurement techniques with subsequent lateral and depth resolution are applied to the surface. As result a complete description of the surface is delivered taking into account special regions of interest. The choice and orientation of the special measurement technique is supported by a new feature extraction method called the fractal pyramid. The advantages of the new concept are demonstrated on example of a ceramic plate with surface faults.
- Keywords:
- topometry, shape measurement, fringe projection, flaw recognition, features, fractal geometry, scale behaviour
- Download:
- IMEKO-WC-2000-TC2-P048.pdf
- DOI:
- -
- Event details
- Event name:
- XVI IMEKO World Congress
- Title:
Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future
- Place:
- Vienna, AUSTRIA
- Time:
- 25 September 2000 - 28 September 2000