ENHANCED MEASUREMENT OF HIGH ASPECT RATIO SURFACES BY APPLIED SENSOR TILTING

A. Schuler, A. Weckenmann, T. Hausotte
Abstract:
During tactile surface measurements the contact point between probing tip and surface varies depending on the local surface angle. To reduce the resulting measurement deviation on high slopes a probing principle is investigated that applies a dynamic surface dependent sensor tilt. This probing process and the logics for the angle determination have been simulative evaluated. A test stand based on a nanometer coordinate measuring machine is developed and fitted with a rotation kinematic based on stacked rotary axes. Systematic positioning deviations of the kinematic are reduced by a compensation field. The test stand has been completed and results are presented.
Keywords:
profilometry, servo system, uncertainty, simulation
Download:
IMEKO-WC-2012-SS2-O1.pdf
DOI:
-
Event details
Event name:
XX IMEKO World Congress
Title:

Metrology for Green Growth

Place:
Busan, REPUBLIC of KOREA
Time:
09 September 2012 - 12 September 2012