OPTICAL PROFILOMETER FOR QUALITY CONTROL OF SOLDERING JOINTS

J. Lettner, G. Gerstorfer, B. G. Zagar
Abstract:
A low cost 3D non–contacting profile scanning method for both specular and diffuse reflecting surfaces will be presented. The resolution in x– and y–directions is about 650 nm and 1 μm in out of plane direction. The method is based on a commercially available CD pickup head. The CD pickup head will be driven in a way that the error of focus signal is used for an out of plane measurement (optical profilometer). Theoretical relations as well as measurement results will be shown in this proposed paper.
Keywords:
optical profilometer, non–contacting measurement, optical inspection technique
Download:
IMEKO-WC-2012-TC2-O3.pdf
DOI:
-
Event details
Event name:
XX IMEKO World Congress
Title:

Metrology for Green Growth

Place:
Busan, REPUBLIC of KOREA
Time:
09 September 2012 - 12 September 2012