A SIMPLE MATHEMATICAL METHOD USED TO DESCRIBE THE INDENTER TIP AREA FUNCTION
Pedro Bastos Costa, Renato Reis Machado
Abstract:
The method called instrumented indentation test (IIT) emerged as a technique capable to characterise several materials in nanoscale, like nanostructural material, thin film, ceramic material, etc., independently of hardness. The acceptation of this new technique requires, of course, reliable test results where, one of the way to obtain this confidence is to knowing the sources of the testing error in order to minimise them.
This work has as main objective to present a simple methodology to get one of these sources by a mathematical computation to determining the geometry of the Berkovich diamond indenter used in the IIT focusing on the very tip of this indenter up to 200 nm height by adjusting the curves that better describe this range.
Keywords:
instrumented indentation test, indenter area function, nanoscale
Download:
IMEKO-WC-2009-TC5-606.pdf
DOI:
-
Event details
Event name:
XIX IMEKO World Congress
Title:

Fundamental and Applied Metrology

Place:
Lisbon, PORTUGAL
Time:
06 September 2009 - 11 September 2009
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