RESEARCH ON INTERDEPENDENCY OF IC VARIABLES |
|---|
| Senzu Shen, Zhengle Shi, Wenjun Chang, Qian Liu, Minghu Zhang |
- Abstract:
- Analysis test (parameter analysis) is very important in measurement and test of IC parameters. The key to solve analysis test problems is how to find out optimal characteristic variable group. In this paper, the mathematical model and application method of choosing characteristic variable group are described with the obtained experimental results. It provides the interrelation of IC variables and their effects on the device operating state.
- Keywords:
- Integrated Circuit Test, Parametric analysis, Interdependency
- Download:
- IMEKO-WC-2009-TC8-089.pdf
- DOI:
- -
- Event details
- Event name:
- XIX IMEKO World Congress
- Title:
Fundamental and Applied Metrology
- Place:
- Lisbon, PORTUGAL
- Time:
- 06 September 2009 - 11 September 2009