ON THE EVALUATION OF ADC STATIC PARAMETERS THROUGH DYNAMIC TESTING |
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| M. Comte, F. Azaïs, S. Bernard, Y. Bertrand, M. Renovell |
- Abstract:
- Full characterization of ADC requires both a histogram-based approach and a spectral analysis to determine respectively static and dynamic parameters. This paper investigates whether static performances can be extracted from spectral analysis, in order to develop a low-cost test procedure. Results show that under appropriate test conditions, the dynamic parameters extracted from a classical FFT exhibit significant variations against ADC offset and gain errors.
- Keywords:
- ADC testing, static and dynamic parameters, spectral analysis
- Download:
- IMEKO-TC4-2002-060.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Conference and Workshop 2002
- Title:
- 4th International Conference on Advanced A/D and D/A Conversion Techniques and their Applications (together with 7th IMEKO TC4 Workshop on ADC Modelling and Testing)
- Place:
- Prague, CZECH REPUBLIC
- Time:
- 26 June 2002 - 28 June 2002