DEMONSTRATOR FOR RESOLUTION INCREASE AND AUTO-CORRECTION IN EMBEDDED MEASUREMENT SYSTEMS |
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| U. Frühauf, E.-G. Kranz, H. Leuterer |
- Abstract:
- For investigation and training of students in the field of high resolution measurement technology was built an embedded measurement system with 16 bit resolution and additional modules for self-diagnostics and autocorrection, including a monitoring measurement system for evaluation.
- Keywords:
- embedded measurement system, autocorrection, evaluation system
- Download:
- IMEKO-TC4-2002-035.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Conference and Workshop 2002
- Title:
- 4th International Conference on Advanced A/D and D/A Conversion Techniques and their Applications (together with 7th IMEKO TC4 Workshop on ADC Modelling and Testing)
- Place:
- Prague, CZECH REPUBLIC
- Time:
- 26 June 2002 - 28 June 2002