SYSTEM FOR TESTING ANALOG-TO-DIGITAL CONVERTERS

Daniel Belega
Abstract:
This paper presents a system named "ADC TEST" that estimates the static and dynamic parameters of an analog-to-digital converter according to the definitions given in IEEE Standard 1241. One shows the available output graphical pages with theirs information and facilities in a practical testing application.
Keywords:
estimation of ADC static and dynamic parameters, testing of ADCs by interpolated fast Fourier transform, windowing
Download:
IMEKO-TC4-2002-031.pdf
DOI:
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Event details
IMEKO TC:
TC4
Event name:
TC4 Conference and Workshop 2002
Title:
4th International Conference on Advanced A/D and D/A Conversion Techniques and their Applications (together with 7th IMEKO TC4 Workshop on ADC Modelling and Testing)
Place:
Prague, CZECH REPUBLIC
Time:
26 June 2002 - 28 June 2002