COMPARISON OF PARAMETERS OF SYSTEMS USED FOR AD CONVERTERS AND MODULES TESTING |
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| Vladimir Haasz, Jaroslav Roztocil , Dominique Dallet, David Slepicka |
- Abstract:
- The paper presents results of ADC testing systems comparison between Laboratoire de microélectronique IXL, University Bordeaux and ADCM&T Laboratory, Dept. of Measurement of FEE CTU, Prague. The comparison was performed using transportable reference AD device designed and developed in FEE CTU.
- Keywords:
- ADC testing, reference AD device, comparative measurement
- Download:
- IMEKO-TC4-2002-008.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Conference and Workshop 2002
- Title:
- 4th International Conference on Advanced A/D and D/A Conversion Techniques and their Applications (together with 7th IMEKO TC4 Workshop on ADC Modelling and Testing)
- Place:
- Prague, CZECH REPUBLIC
- Time:
- 26 June 2002 - 28 June 2002