IMPROVEMENT OF STEP-GAUSS ADC STOCHASTIC TEST METHOD

Jan Holub, Josef Vedral, Miroslav KubĂ­n
Abstract:
Improvement of Analog-to-Digital Converters testing method that is suitable for testing of high-resolution AD converters (e.g. Σ-Δ or dither-based) or on the contrary ultra high-speed AD converters is presented. The method is based on the histogram test driven by stochastic signal with defined probability density function. By repeating of the test for different settings of band-pass filter that is inserted to the input testing signal path it is possible to obtain an estimation of frequency dependency of effective number of bits. The results have to be recalculated to equivalent band-pass filtering. Practical demonstration confirmed wider applicability than for direct band-pass filter application.
Keywords:
ENOB, ADC, stochastic signal
Download:
IMEKO-TC4-2002-006.pdf
DOI:
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Event details
IMEKO TC:
TC4
Event name:
TC4 Conference and Workshop 2002
Title:
4th International Conference on Advanced A/D and D/A Conversion Techniques and their Applications (together with 7th IMEKO TC4 Workshop on ADC Modelling and Testing)
Place:
Prague, CZECH REPUBLIC
Time:
26 June 2002 - 28 June 2002