DIFFERENTIAL NON-LINEARITY, INTEGRAL NON-LINEARITY, AND SIGNAL TO NOISE RATIO OF AN ANALOG TO DIGITAL CONVERTER

Y. C. Jenq, Qiong Li
Abstract:
The Analog to digital converter (ADC) has been widely used in all kinds of modern electronic instruments, so it is desirable to find out the relationship between various errors and the performance of ADC and improve the performance with a low cost operation. This paper studies and tries to quantify the relationship between the differential non-linearity (DNL) error, the integral non-linearity (INL) error and the signal to noise ratio (SNR) performance of an ADC, and investigates various methods to reduce the effect of these errors to increase the SNR. Major results are obtained by computer simulation, while a simple analytic model is also investigated. It is found that the loss of SNR due to DNL roughly follows the “6 dB per LSB” rule, and the major cause of the significant SNR loss is primarily due to harmonic distortion introduced by the INL. The investigation of the analytic model of the INL shows that it can predict the SNR loss very similar to the result obtained by computer simulation. We also study various methods to improve the SNR performance of the ADC. It is found that the Midpoint method, although simple, can almost completely eliminate the effect of the INL. It is also shown that if the ratio of the sampling frequency to the input signal frequency is large, the DNL can be further reduced to improve the SNR by Grouping and Sorting method.
Download:
IMEKO-TC4-2002-004.pdf
DOI:
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Event details
IMEKO TC:
TC4
Event name:
TC4 Conference and Workshop 2002
Title:
4th International Conference on Advanced A/D and D/A Conversion Techniques and their Applications (together with 7th IMEKO TC4 Workshop on ADC Modelling and Testing)
Place:
Prague, CZECH REPUBLIC
Time:
26 June 2002 - 28 June 2002