DIGITAL TO ANALOG CONVERTERS: A METROLOGICAL OVERVIEW
E. Balestrieri, P. Daponte, S. Rapuano
Abstract:
In the last years the technology improvement of Digital-to-Analog Converters (DACs) has extended the use of digital techniques in a multitude of applications. Consequently, there is an increasing attention to DAC topics, from researchers and manufacturers. The paper is aimed at providing a metrological overview and the leading trends of the research in the field of DACs.
Download:
IMEKO-IWADC-2004-010.pdf
DOI:
-
Event details
IMEKO TC:
TC4
Event name:
IWADC 2004
Title:

IXth International Workshop on ADC Modeling and Testing, IWADC (together with XIII IMEKO TC4 International Symposium on Measurements for Research and Industrial Applications) (IWADC)

Place:
Athens, GREECE
Time:
29 September 2004 - 01 October 2004
 Back