IMPROVED RESIDUAL ANALYSIS IN ADC TESTING |
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| István Kollár |
- Abstract:
- Analog-to-digital converters are commonly tested by applying a pure sine wave at their inputs. Since the exact parameters of the sine wave are very difficult to precisely obtain, an indirect method is used: the measured samples are used to determine the sine wave which best fits them. The ADC is characterized then by analysis of the differences between the samples and the sine wave. This is described in the IEEE standards 1241-2000 and 1057-1994.
The generally applied method for the fit is least squares (LS). If the error (the deviation of the ADC output samples from the true sine wave) is a random sequence, with independent, identically distributed zero-mean samples, the LS fit effectively averages it out. However, when the quantization errors dominate in the observations, this is not true. Strange, systematic errors may arise, which cannot be averaged out. The paper examines these errors, and makes suggestions how to reduce them. - Keywords:
- IEEE Standard 1241-2000, IEEE Standard 1057-1994, ADC test, analog-to-digital converter, sine wave fitting, least squares, effective number of bits, ENOB
- Download:
- IMEKO-IWADC-2004-009.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- IWADC 2004
- Title:
IXth International Workshop on ADC Modeling and Testing, IWADC (together with XIII IMEKO TC4 International Symposium on Measurements for Research and Industrial Applications) (IWADC)
- Place:
- Athens, GREECE
- Time:
- 29 September 2004 - 01 October 2004