FAST ESTIMATION OF A/D CONVERTER NONLINEARITIES
F. Stefani, A. Moschitta, D. Macii, P. Carbone, D. Petri
Abstract:
This paper deals with an innovative strategy to shorten the record size required to estimate the Integral Non-Linearity (INL) of Analog-to-Digital Converters (ADC’s) through the so-called Sinewave Histogram Test (SHT). Such a size reduction is achieved by low-pass filtering the collected sequences of test samples using a simple moving average filter. After some preliminary simulations, the validity of the proposed approach have been confirmed by some experimental results.
Download:
IMEKO-IWADC-2004-004.pdf
DOI:
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Event details
IMEKO TC:
TC4
Event name:
IWADC 2004
Title:

IXth International Workshop on ADC Modeling and Testing, IWADC (together with XIII IMEKO TC4 International Symposium on Measurements for Research and Industrial Applications) (IWADC)

Place:
Athens, GREECE
Time:
29 September 2004 - 01 October 2004
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