ELECTRONIC CIRCUITS PARAMETRIC MEASUREMENT: A NEW APPROACH IN ELECTRICAL METROLOGY |
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| José Carlos Oliveira, Diamantino Silva Freitas, Artur Capelo Cardoso |
- Abstract:
- The measurement of electrical quantities in electronic circuits is inscribed in the non-parametric world for a long time. Multimeters, Oscilloscope and Network Analysers are the preferred tools used by engineers. Parametric identification allows a new step in circuit characterization. This approach opens new perspectives in the process of electronic circuit’s design. The present paper presents a solution to the problem of parametric characterization. To allow the simulation and validation of the results a new simulation tool is also presented. The proposed simulation solution uses modified off-the-shelf standard software packages, integrates them closely, offering an expeditious way of bringing mathematical postprocessing power to a standard electronic simulation package, in the framework of circuit design and characterization or measurement.
- Keywords:
- Electronic Circuit characterization, simulation, parametric measurement
- Download:
- PWC-2003-TC4-099.pdf
- DOI:
- -
- Event details
- Event name:
- XVII IMEKO World Congress
- Title:
Metrology in the 3rd Millennium
- Place:
- Dubrovnik, CROATIA
- Time:
- 22 June 2003 - 28 June 2003