THE INFLUENCE OF SAMPLING PARAMETERS ON ACCURACY OF CAPACITANCE MEASUREMENT IN THE METHOD BASED ON DSP

Grzegorz Lentka, Jerzy Hoja
Abstract:
The paper presents the method of measurement of impedance parameters based on measurement signals sampling and DSP. The influence of main sources of uncertainty and errors on capacitance measurement accuracy has been analysed. The following have been included: non-synchronous sampling of two measurement signals proportional to current and voltage on impedance under measurement, A/D converter resolution and total number of collected samples. The results of simulations have been presented.
Download:
IMEKO-TC4-2004-043.pdf
DOI:
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Event details
IMEKO TC:
TC4
Event name:
TC4 Symposium 2004
Title:
XIII IMEKO TC4 International Symposium on Measurements for Research and Industrial Applications (together with IXth International Workshop on ADC Modeling and Testing, IWADC)
Place:
Athens, GREECE
Time:
29 September 2004 - 01 October 2004