AN AUTOMATIC TEST FOR THE SOFTWARE RELIABILITY: THE EVALUATION OF THE OVERFLOW DUE TO MEMORY LEAKS AS FAILURE CAUSE

Marcantonio Catelani, Lorenzo Ciani, Valeria L. Scarano, Alessandro Bacioccola
Abstract:
In order to guarantee a software with high quality level vs a reasonable cost, the testing planning phase has to be study in detail, also to reduce the test time. This paper introduces the result of the application of software automatic test to one of the most common software failure causes: the overflow due to memory leaks. The analysis carried out on a single software failure cause wants to show the total generality of the technique and to define some parameters of life of the software. The general value of the method is shown applying the technique to different software and for everyone of them defining the mean time to failure, where with failure we mean only the failure due to overflow; even if the overflow it isn’t the only analyzable failure cause through the application of such software automatic test.
Download:
IMEKO-TC4-2008-214.pdf
DOI:
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Event details
IMEKO TC:
TC4
Event name:
Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements
Title:
XVIth IMEKO TC4 International Symposium on Electrical Measurements and Instrumentation (together with 13th IMEKO TC4 Workshop on ADC Modelling and Testing)
Place:
Florence, ITALY
Time:
22 September 2008 - 24 September 2008