MEASUREMENT OF LOW FREQUENCY NOISE OF MONOCRYSTALLINE SILICON SOLAR CELLS
Zdenek Chobola, Lech Hasse, Zbynek Ružicka
Abstract:
Noise measured across silicon single-crystal solar cells may serve as a non-destructive reliability indicator of the devices. The noise sources in monocrystalline solar cells has been described. The noise measuring system and the results of measurement of circular form cells (a diameter of 100 mm and a thickness of 360 µm) have been presented. The DLTS measurements performed on investigated solar cells approved the noise measurement results.
Keywords:
noise measurement, silicon solar cell, reliability
Download:
PWC-2003-TC4-076.pdf
DOI:
-
Event details
Event name:
XVII IMEKO World Congress
Title:

Metrology in the 3rd Millennium

Place:
Dubrovnik, CROATIA
Time:
22 June 2003 - 28 June 2003
 Back