PROBABILISTIC EVALUATION OF TEST ARCHITECTURES FOR FULLY DIFFERENTIAL CIRCUITS
Wojciech Toczek
Abstract:
The paper presents probabilistic model predestined to the evaluation, comparison and optimization of test architectures for fully differential (FD) circuits. The model have the form of analytical formulae that describe the probability density functions of the signal being measured during testing. The first density function is the generalized form of the Rayleigh distribution. It is relevant for representing a fault-free circuit. The second one is the generalized form of the Rician distribution. It is appropriate for modelling magnitude responses of a faulty CUT as well as a fault-free circuit. The parameters of the models are calculated using Taylor's series approximation method. The model was validated by comparison to the results obtained by Monte Carlo simulation and applied to evaluation of test architectures for a FD bandpass filter. One of the architectures is proposed by the author. The dependence of the probabilistic features of the test responses on the type of testing circuitry and on the testing frequency is demonstrated. It is shown that the testing methods, which exploit common-mode excitation of the CUT, have better probabilistic features than the method, which uses the differential mode excitation.
Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements
Title:
XVIth IMEKO TC4 International Symposium on Electrical Measurements and Instrumentation (together with 13th IMEKO TC4 Workshop on ADC Modelling and Testing)
