A SELF-TESTING APPROACH TO TESTING OF MIXED ANALOGDIGITAL MICROSYSTEMS BASED ON MICROCONTROLLERS |
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| Zbigniew Czaja |
- Abstract:
- A new approach based on the 4D method is proposed to self-testing of analog networks (circuits) of mixed analog-digital microsystems controlled by microcontrollers. It is characterised by simplicity and facility of the implementation of diagnosis algorithms in simple and popular microcontrollers. In the paper the creation of a fault dictionary and self-testing procedures of analog networks (single soft fault detection and localisation) for these microsystems are described.
- Keywords:
- self-testing, diagnosis methods, microsystems, microcontrollers
- Download:
- PWC-2003-TC4-066.pdf
- DOI:
- -
- Event details
- Event name:
- XVII IMEKO World Congress
- Title:
Metrology in the 3rd Millennium
- Place:
- Dubrovnik, CROATIA
- Time:
- 22 June 2003 - 28 June 2003